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                                上海伯東真空產品事業部搬遷通知

                                原子力顯微鏡 Ambient AFM / MFM
                                閱讀數: 1267

                                原子力顯微鏡 Ambient AFM / MFM

                                Ambient AFM / MFM 原子力顯微鏡
                                上海伯東代理英國 NanoMagnetics AFM - 原子力顯微鏡, 高精度和高分辨率使其可以分析許多不同樣品, AFM - 原子力顯微鏡可以在液體或空氣中測量. 手動校準, 采用白光 LED, 亮度可調, 視野更佳. Z 噪音降至25 fm/√Hz.

                                Ambient AFM / MFM 原子力顯微鏡系統參數
                                標準掃描模式
                                • Intermittent Contact / Phase Contrast
                                • Contact
                                • Non-contact
                                • Lateral Force
                                • MFM
                                • EFM
                                (Any single mode standard, additional modes may be
                                added as options.)
                                可選掃描模式
                                • Scanning Tunneling Microscope (STM)
                                • Piezo Response Force Microscope (PrFM)
                                • Kelvin Probe Force Microscope (KPFM)
                                • Scanning Spreading Resistance Microscope (SSRM)
                                • Conductive AFM
                                • Capacitance Force Microscopy (CFM)
                                • Force Modulation Microscopy (FMM)
                                • AFM Spectroscopies
                                • Nanoindentation
                                • Nanolitography
                                Maximum Z Resolution
                                • <0.03nm with 100μmx100μm scanner
                                • <0.01nm with 40μmx40μm scanner
                                • <0.005nm with 4μmx4μm scanner
                                Static/Dynamic RMS Cantilever Z Noise
                                • <25fm √Hz noise floor with laser RF modulation
                                Scan Range
                                • 4x4x2 μm or 40x40x4 μm or 100x100x8 μm
                                STM Current Range
                                • 1pA-10nA, < 10fA / √Hz noise floor
                                Maximum Sample Size/Height
                                • 30x30x10 mm
                                Approach
                                • Software controlled
                                • Motorized
                                • <50 mm range with <250 nm sensivity
                                Camera
                                • CCD analog colour camera
                                Camera Resolution
                                • < 2 μm
                                Light Source for Optical Microscope
                                • White LED, adjustable from software
                                Signal Processing
                                • 16 bit ADCs / 24 bit DACs
                                • Digital feedback with FPGA / DSP
                                • Simultaneous scan of 16 channels
                                up to 4096x4096 pixels
                                Cantilevers
                                • All of the commercial cantilevers can be used
                                Acoustic and Vibration Isolation
                                • Multilayer acoustic enclosure 180°access
                                0.3Hz passive vibration isolation table
                                原子力顯微鏡AFM

                                     Polyethyleneimine            Phosphorylcolamine Topography  Phosphorylcolamine Phase Contrast    Polyvinyl Acetate



                                 

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